Optical transmittance of 3D printing materials

The increasing prevalence of three-dimensional (3D) printing optical housings and mounts necessitates a better understanding the properties materials. This paper describes method for using multithickness samples 3D materials to measure transmittance spectra at wavelengths from 400 2400 nm [visible short-wave infrared (IR)]. In this method, with material thicknesses 1, 2, 3, 4 mm were positioned in front uniform light source spectrometer probe on opposing side transmittance. Transmission depended primarily thickness color sample, multiple scattering prevented use simple exponential model relate transmittance, extinction, thickness. A Solidworks file printer are included enable measurements additional same method.